The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 18, 2022

Filed:

Oct. 04, 2017
Applicant:

Atonarp Inc., Tokyo, JP;

Inventor:
Assignee:

ATONARP INC., Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01J 49/00 (2006.01); G06N 20/00 (2019.01); G01N 27/62 (2021.01); G06F 16/901 (2019.01);
U.S. Cl.
CPC ...
H01J 49/0036 (2013.01); G06F 16/901 (2019.01); G06N 20/00 (2019.01); G01N 27/62 (2013.01);
Abstract

System for quantifying a composition of a target sample based on a scan output of a first type of sensor includes a reference database, a custom database and a set of modules. The set of modules includes an analytical model creation module that creates an analytical model of the first type of sensor, a sample processing module that processes samples that include accurately known compositions using the first type of sensor under a standard pressure condition, a molecular fraction estimation module that estimates molecular fraction of the samples using an estimation method and the analytical model, an analytical model optimization module that optimizes the analytical model by comparing the molecular fraction of the samples with a pre-determined molecular fraction of the samples, and a target composition estimation module that estimates a composition of the target sample based on the scan output using the estimation method with the optimized analytical model.


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