The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 18, 2022
Filed:
Sep. 19, 2019
Shanghai United Imaging Intelligence Co., Ltd., Shanghai, CN;
Quan Huo, Shanghai, CN;
Feng Shi, Shanghai, CN;
Qingfeng Li, Shanghai, CN;
Bokai Li, Shanghai, CN;
Yiqiang Zhan, Shanghai, CN;
SHANGHAI UNITED IMAGING INTELLIGENCE CO., LTD., Shanghai, CN;
Abstract
A method for assessing a condition of an organ or tissue of a target object is provided. The method may include: obtaining a target image of the target object; segmenting a target region from the target image, the target region of the target image corresponding to a sub-region of the organ or tissue; determining a morphological characteristic value of the target region in the target image; obtaining a reference standard associated with a sample organ or tissue of a plurality of sample objects, the sample organ or tissue being of a same type as the organ or tissue of the target object; and assessing the condition of the organ or tissue of the target object by comparing the morphological characteristic value of the target region in the target image with the reference standard.