The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 18, 2022

Filed:

Aug. 08, 2019
Applicant:

Loyola University Chicago, Maywood, IL (US);

Inventors:

Michael Patrick Murphy, Downers Grove, IL (US);

Cameron James Killen, Chicago, IL (US);

Karen Wu, Chicago, IL (US);

Assignee:

Loyola University Chicago, Maywood, IL (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/00 (2017.01); G06T 7/62 (2017.01); G06T 7/73 (2017.01);
U.S. Cl.
CPC ...
G06T 7/0012 (2013.01); G06T 7/62 (2017.01); G06T 7/74 (2017.01); G06T 2207/10124 (2013.01); G06T 2207/20081 (2013.01); G06T 2207/20084 (2013.01); G06T 2207/30052 (2013.01);
Abstract

Methods for classifying and measuring orientations of objects, as nonlimiting examples, implants utilizing two-dimensional radiographs. One such method determines a three-dimensional orientation of an object based on its area projected onto a two-dimensional image and known or measured geometry. Another such method provides an automated solution to computationally determine the orientation and characterizing features of an implant based on two-dimensional radiographs. Orientations and characteristics of one or more objects in the vicinity of an object of interest may also be determined.


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