The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 18, 2022
Filed:
Sep. 30, 2020
North China Institute of Aerospace Engineering, Hebei, CN;
Long Li, Hebei, CN;
Xuqing Li, Hebei, CN;
Qinxue Zhang, Hebei, CN;
Yongtao Jin, Hebei, CN;
Guohong Li, Hebei, CN;
Di Liu, Hebei, CN;
Yuanping Liu, Hebei, CN;
Abstract
The present invention discloses an automatic interpretation method for winter wheat based on a deformable fully convolutional neural network (FCN). The method includes the following steps: step: using a region corresponding to a winter wheat planting area as a research region, and obtaining a high-resolution remote sensing image of the research region; step: preprocessing the obtained remote sensing image: extracting geometric changes of sizes, fields of view, postures, and partial deformation of winter wheat objects in different spatial positions in the high-resolution image as sample data; step: establishing the deformable FCN; step: inputting the sample data to the deformable FCN to implement training of the deformable FCN; and step: inputting a to-be-recognized remote sensing image of winter wheat to the trained deformable FCN, and outputting a prediction graph of a winter wheat planting area in a to-be-recognized region.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile