The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 18, 2022
Filed:
Jun. 12, 2019
Mitsubishi Heavy Industries, Ltd., Tokyo, JP;
Naoki Matsuura, Tokyo, JP;
Mitsuyoshi Uematsu, Tokyo, JP;
MITSUBISHI HEAVY INDUSTRIES, LTD., Tokyo, JP;
Abstract
A method of evaluating equivalence of detection performances of an object to be photographed using a film image and a digital image. The method includes acquiring digital images of the object with varying values of an influence parameter; acquiring digital detection limit values of the respective digital images; specifying a digital detection limit value with highest detection performance from the digital detection limit values; determining that there is equivalence when the specified digital detection limit value is equal to or more than a film detection limit value of the film image, because the detection performance of the object using the digital image assures the detection performance of the object using the film image; and determining that there is no equivalence when the specified digital detection limit value is smaller than the film detection limit value.