The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 18, 2022

Filed:

Oct. 03, 2018
Applicant:

Arkose Labs Holdings, Inc., San Francisco, CA (US);

Inventors:

Suresh N. Chari, Yorktown Heights, NY (US);

Ian Michael Molloy, Chappaqua, NY (US);

Youngja Park, Princeton, NJ (US);

Assignee:

Arkose Labs Holdings, Inc., San Francisco, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06N 20/00 (2019.01); G06F 21/55 (2013.01); H04L 29/06 (2006.01); G06N 20/20 (2019.01);
U.S. Cl.
CPC ...
G06N 20/00 (2019.01); G06F 21/55 (2013.01); G06F 21/554 (2013.01); G06N 20/20 (2019.01); H04L 63/1425 (2013.01); G06F 2221/034 (2013.01);
Abstract

A method for anomaly detection on a system or application used by a plurality of users includes providing an access to a memory device storing user data samples of a usage of the system or application for all users of the plurality of users. A target user is selected from among the plurality of users, using a processor on a computer, with data samples of the target user forming a cluster of data points in a data space. The data samples for the target user are used to generate a normal sample data set as training data set for training a model for an anomaly detection monitor for the target user. A local outlier factor (LOF) function is used to generate an abnormal sample data set for training the anomaly detection monitor for the target user.


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