The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 18, 2022

Filed:

Nov. 04, 2016
Applicant:

Fanuc Corporation, Yamanashi, JP;

Inventors:

Yuta Namiki, Yamanashi, JP;

Fumikazu Warashina, Yamanashi, JP;

Assignee:

FANUC CORPORATION, Yamanashi, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/68 (2006.01); G06K 9/00 (2006.01); G06K 9/62 (2006.01); G06T 7/77 (2017.01); G06K 9/46 (2006.01); G06T 7/73 (2017.01); G06K 9/48 (2006.01);
U.S. Cl.
CPC ...
G06K 9/00208 (2013.01); G06K 9/46 (2013.01); G06K 9/4604 (2013.01); G06K 9/468 (2013.01); G06K 9/6202 (2013.01); G06K 9/6204 (2013.01); G06K 9/6211 (2013.01); G06K 9/6212 (2013.01); G06K 9/6254 (2013.01); G06K 9/6255 (2013.01); G06T 7/75 (2017.01); G06T 7/77 (2017.01); G06K 2009/487 (2013.01);
Abstract

An image processing device that detects an image of an object from input data captured by a vision sensor, on the basis of a model pattern including a set of a plurality of first feature points representing the shape of the object, includes an object detection unit that detects images of the object by matching between a plurality of second feature points extracted from the input data and a plurality of first feature points forming the model pattern, a corresponding point selection unit that selects, for each image of the object, second feature points corresponding to the first feature points and stores the selected second feature points as corresponding points, and a model pattern correction unit that calculates a statistic of a predetermined physical quantity of the plurality of corresponding points associated with each first feature point and corrects the first feature point on the basis of the statistic.


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