The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 18, 2022
Filed:
Nov. 05, 2019
International Business Machines Corporation, Armonk, NY (US);
Tuo Wang, North York, CA;
Lior Aronovich, Thornhill, CA;
Ziyue Jason Wang, North York, CA;
Yu-Ching Chen, North York, CA;
International Business Machines Corporation, Armonk, NY (US);
Abstract
Provided is a method for identifying problematic input fields in a webform. The method comprises obtaining a set of user interaction data for a plurality of user interactions with input fields of a webform. The user interaction data for each input field includes data corresponding to at least one aspect. The method comprises assigning an aspect value to each aspect of each user interaction with each input field. The method comprises aggregating aspect values into an aggregated aspect value for each input field, generating a score for each input field based at least in part on the aggregated aspect field, ranking the input fields by their respective scores to identify at least one particular input field in the webform as problematic, and indicating that the at least one particular input field in the webform is problematic.