The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 18, 2022
Filed:
Jul. 03, 2019
Hitachi, Ltd., Tokyo, JP;
Mika Takata, San Jose, CA (US);
HITACHI, LTD., Tokyo, JP;
Abstract
Example implementations described herein are directed to systems and methods for selecting appropriate data samples and features in an access and privacy restricted system. Example implementations involve selection of appropriate samples (e.g. patients) which have enough data sources bringing highly important factors based on the experienced risk factors at other facilities, which is stored as metadata. The risk factor management puts more prioritization on some patients which have more data in the required data source than the other patients among all data sample candidates. The similarity of the training data sample can be a criteria to select new sample sets. Further, the risk factor management selects valuable features effectively based on metadata derived from other facilities. Example implementations help improve machine learning accuracy as part of daily system management in a facility, and can be deployed across facilities without compromising access or privacy restrictions of the data.