The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 18, 2022

Filed:

Jun. 08, 2020
Applicant:

Splunk Inc., San Francisco, CA (US);

Inventors:

Cory Eugene Burke, San Bruno, CA (US);

Jacob Barton Leverich, San Francisco, CA (US);

Jeffrey Thomas Lloyd, South San Francisco, CA (US);

Adam Jamison Oliner, San Francisco, CA (US);

Marc Vincent Robichaud, San Francisco, CA (US);

Jesse Miller, Piedmont, CA (US);

Assignee:

SPLUNK INC., San Francisco, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 16/248 (2019.01); G06F 11/30 (2006.01); G06F 16/245 (2019.01); G06F 16/242 (2019.01); G06F 11/34 (2006.01);
U.S. Cl.
CPC ...
G06F 16/248 (2019.01); G06F 11/3065 (2013.01); G06F 11/3452 (2013.01); G06F 16/242 (2019.01); G06F 16/245 (2019.01);
Abstract

A facility for defining an event subtype using examples is described. The facility displays events identified among machine-generated data. The facility receives user input selecting a first subset of the events as examples of an event subtype. In response to receiving the user input, the facility displays a second subset of the events predicted to belong to the event subtype on the basis of the examples of the event subtype.


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