The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 18, 2022
Filed:
Sep. 28, 2018
Splunk Inc., San Francisco, CA (US);
Kieran Nicholas Cairney, Vancouver, CA;
Jindrich Dinga, Los Altos, CA (US);
Murugan Kandaswamy, Sunnyvale, CA (US);
Vishal Patel, San Francisco, CA (US);
SPLUNK INC., San Francisco, CA (US);
Abstract
A log-to-metrics transformation system includes a log-to-metrics application executing on a processor. The log-to-metrics transformation system receives a format associated with machine data, and further receives, via a first graphical control, a first set of metric identifiers corresponding to a first set of metrics associated with the machine data. The log-to-metrics transformation system generates a first set of mappings between the first set of metric identifiers and a first set of field values included in the machine data. The log-to-metrics transformation system stores the first set of mappings and an association with the format of the machine data. The log-to-metrics transformation system, based on the first set of mappings, causes the first set of field values to be extracted from the machine data. Further, a first metric included in the first set of metrics is determined based on at least a portion of the first set of field values.