The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 18, 2022
Filed:
Oct. 19, 2020
International Business Machines Corporation, Armonk, NY (US);
Nadiya Kochura, Bolton, MA (US);
VinodKumar Raghavan Nair, Westford, MA (US);
Donald H. Randall, Jr., Austin, TX (US);
Derek M. Reedy, Ayer, MA (US);
Timothy B. Snow, Westford, MA (US);
INTERNATIONAL BUSINESS MACHINES CORPORATION, Armonk, NY (US);
Abstract
According to an aspect, software test failures are analyzed using natural language processing (NLP) and machine learning. A failure is detected during a code build associated with a software product. Each change set since a last successful code build associated with the software product is identified and analyzed using NLP to extract change set features. A software defect origin model is applied to the extracted features in each analyzed change set to detect an origin of the failure.