The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 18, 2022

Filed:

Jun. 10, 2019
Applicant:

Hitachi, Ltd., Tokyo, JP;

Inventors:

Koichiro Iijima, Los Gatos, CA (US);

Song Wang, San Carlos, CA (US);

Hideki Nakamura, Menlo Park, CA (US);

Chetan Gupta, San Mateo, CA (US);

Assignee:

HITACHI, LTD., Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 9/445 (2018.01); G06F 9/451 (2018.01); G06F 16/21 (2019.01); G06F 11/36 (2006.01);
U.S. Cl.
CPC ...
G06F 9/44589 (2013.01); G06F 9/451 (2018.02); G06F 11/3664 (2013.01); G06F 11/3688 (2013.01); G06F 11/3692 (2013.01); G06F 16/212 (2019.01);
Abstract

Example implementations described herein are directed to a meta-data processing system that supports the creation and deployment of the Analytical Solution Modules in development of industrial analytics. The example implementations described herein can involve a first system configured to be directed to a data scientist for receiving flow and operator definitions to generate an analytics library, which is provided to a second system configured to be directed to a domain expert for applying the analytics library to generate analytics modules to be executed on data input to the second system.


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