The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 18, 2022
Filed:
Apr. 22, 2020
Fanuc Corporation, Yamanashi, JP;
Yousuke Ootomo, Yamanashi, JP;
FANUC CORPORATION, Yamanashi, JP;
Abstract
An anomaly detection device includes: a machining state collection unit which collects machining execution information at a predetermined time interval; a machining execution information recording unit which records the collected machining execution information in a storage unit; a selection unit which selects, from a set of a plurality of pieces of machining execution information recorded by executing a machining command a plurality of times, a subset of the machining execution information in order to calculate an average pattern according to a machining step which is an analysis target; an average pattern calculation unit which calculates the average pattern corresponding to the machining step of the analysis target based on the subset; and an anomaly detection unit which compares the machining execution information in the machining step of the analysis target with the average pattern to detect whether or not an anomaly occurs in the machining step of the analysis target.