The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 18, 2022

Filed:

May. 15, 2019
Applicant:

The Regents of the University of Colorado, Denver, CO (US);

Inventors:

Juliet T. Gopinath, Boulder, CO (US);

Victor M. Bright, Boulder, CO (US);

Omkar D. Supekar, Boulder, CO (US);

Wei Yang Lim, Boulder, CO (US);

Mo Zohrabi, Boulder, CO (US);

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/64 (2006.01); G02B 26/00 (2006.01); G02B 3/12 (2006.01); G02B 21/00 (2006.01); G02B 26/02 (2006.01);
U.S. Cl.
CPC ...
G02B 26/005 (2013.01); G01N 21/6458 (2013.01); G02B 3/12 (2013.01); G02B 21/0076 (2013.01); G02B 26/02 (2013.01);
Abstract

A system for high resolution multiphoton excitation microscopy is described herein. In one embodiment, the system may include an electrowetting on dielectric (EWOD) prism optically coupled to an excitation source, the EWOD prism adapted or configured to: receive a light beam from the excitation source, and project the received light beam onto a sample plane based on a tunable transmission angle of the EWOD prism, and a fluorescence imaging microscope adapted or configured to: receive a fluorescence signal from the sample plane based on the projected light beam, and relay the fluorescence signal from the sample plane to a set of detectors.


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