The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 18, 2022

Filed:

Jul. 19, 2017
Applicant:

Siemens Healthcare Diagnostics Inc., Tarrytown, NY (US);

Inventors:

Joson K. Joseph, Bear, DE (US);

Bestin Abraham, Newark, DE (US);

Frank Krufka, Kirkwood, PA (US);

Tan Bui, Middletown, DE (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 35/00 (2006.01); G01N 21/27 (2006.01); G01N 21/25 (2006.01);
U.S. Cl.
CPC ...
G01N 35/00693 (2013.01); G01N 21/253 (2013.01); G01N 21/274 (2013.01); G01N 35/00732 (2013.01); G01N 2201/0256 (2013.01); G01N 2201/0415 (2013.01); G01N 2201/12715 (2013.01);
Abstract

A computer-implemented method for calibrating a photometer in an in-vitro diagnostics analyzer includes generating a cuvette map of a reaction ring identifying a plurality of cuvette locations. The cuvette map is used to identify a plurality of reference measurement areas between the plurality of cuvette locations. A plurality of reference measurements are acquired in the reference measurement areas using the photometer. The photometer is automatically calibrated based on a comparison of the reference measurements to a predetermined standard setup of the photometer.


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