The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 18, 2022

Filed:

Feb. 03, 2016
Applicant:

Hitachi High-technologies Corporation, Tokyo, JP;

Inventors:

Atsushi Kamino, Tokyo, JP;

Hisayuki Takasu, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 1/32 (2006.01); H01J 37/20 (2006.01); H01J 37/305 (2006.01);
U.S. Cl.
CPC ...
G01N 1/32 (2013.01); H01J 37/20 (2013.01); H01J 37/3053 (2013.01); H01J 2237/026 (2013.01); H01J 2237/204 (2013.01); H01J 2237/2007 (2013.01); H01J 2237/20214 (2013.01); H01J 2237/31745 (2013.01);
Abstract

The present invention is directed to a side entry type sample holder which enables observation with an observation apparatus without removing the sample to be analyzed from the sample holder after processing the sample to be analyzed by a processing apparatus. The sample holder includes a grip, a sample holder main body extending from the grip, a tip portion which is connected to the sample holder main body and provided with a sample table for fixing a sample, and a mechanism which changes a relative positional relationship between a processing surface of the sample fixed to the sample table and an irradiation direction of an ion beam, and causes the tip portion to avoid irradiation with the ion beam during sample processing.


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