The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 18, 2022
Filed:
Dec. 02, 2018
Lumus Ltd., Ness Ziona, IL;
Lilya Lobachinsky, Tel Aviv, IL;
Yochay Danziger, Kfar Vradim, IL;
Nitzan Livneh, Rehovot, IL;
Jonathan Gelberg, Modiin, IL;
LUMUS LTD., Ness Ziona, IL;
Abstract
At various positions in an eye motion box (EMB) an output image from an optical device can be captured and analyzed for detection and evaluation of image propagation via the optical device. Optical testing along a specific axis can evaluate optical engine transfer function uniformity across facet's active area, detect the existence and degree of 'smearing' of a projected image from an optical device, and detect the existence and degree of a 'white stripes' (WS) phenomenon related to scattering and diffraction in the wedge-to-LOE interface. A variety of metrics can be derived for quality control and feedback into the production system, and for disposition of the optical devices.