The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 18, 2022

Filed:

Dec. 27, 2018
Applicant:

Benano Inc., Taipei, TW;

Inventors:

Liang-Pin Yu, Taipei, TW;

Yeong-Feng Wang, Taipei, TW;

Chun-Di Chen, Taipei, TW;

Yun-Ping Kuan, Taipei, TW;

Assignee:

BENANO INC., Taipei, TW;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01B 11/25 (2006.01); G06T 7/521 (2017.01);
U.S. Cl.
CPC ...
G01B 11/2518 (2013.01); G06T 7/521 (2017.01); G06T 2207/10152 (2013.01);
Abstract

A three-dimensional scanning system includes a projection light source, an image capturing apparatus, and a signal processing apparatus. The projection light source is configured to project a two-dimensional light to a target, where the two-dimensional light has a spatial frequency. The image capturing apparatus captures an image of the target illuminated with the two-dimensional light. The signal processing apparatus is coupled to the projection light source and the image capturing apparatus, to analyze a definition of the image of the two-dimensional light, where if the definition of the image of the two-dimensional light is lower than a requirement standard, the spatial frequency of the two-dimensional light is reduced.


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