The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 18, 2022
Filed:
Jun. 06, 2018
Nidek Co., Ltd., Gamagori, JP;
Michihiro Takii, Aichi, JP;
Kunihito Mizukoshi, Aichi, JP;
Tomoya Ishii, Aichi, JP;
Kyoji Takeichi, Aichi, JP;
NIDEK CO., LTD., Aichi, JP;
Abstract
An eyeglass frame shape measurement device measures a shape of an eyeglass frame. The eyeglass frame shape measurement device includes a light projecting optical system that has a light source and emits measurement light from the light source toward a groove of a rim of an eyeglass frame, a light receiving optical system that has a detector and causes the detector to receive reflected light of the measurement light emitted toward the groove in the rim of the eyeglass frame by the light projecting optical system and reflected by the groove of the rim of the eyeglass frame, an acquisition section that acquires a cross-sectional shape of the groove of the rim of the eyeglass frame on the basis of the reflected light received by the detector, and a luminance control section that controls a luminance level of the reflected light to be received by the detector.