The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 18, 2022
Filed:
Mar. 14, 2017
Mayo Foundation for Medical Education and Research, Rochester, MN (US);
James F. Greenleaf, Rochester, MN (US);
Carolina Amador Carrascal, Rochester, MN (US);
Shigao Chen, Rochester, MN (US);
Matthew W. Urban, Rochester, MN (US);
Armando Manduca, Rochester, MN (US);
Mayo Foundation for Medical Education and Research, Rochester, MN (US);
Abstract
Described here are systems and methods for estimating shear wave velocity from data acquired with a shear wave elastography system. More particularly, the systems and methods described here implement a spatiotemporal time-to-peak algorithm that searches for the times at which shear wave motion is at a maximum while also searching for the lateral locations at which shear wave motion is at a maximum. Motion can include displacement, velocity, or acceleration caused by propagating shear waves. A fitting procedure (e.g., a linear fit) is performed on a combined set of these temporal peaks and spatial peaks to estimate the shear wave velocity, from which mechanical properties can be computed. Motion amplitude thresholding can also be used to increase the number of points for the fitting.