The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 18, 2022
Filed:
Nov. 25, 2019
Accuray, Inc., Sunnyvale, CA (US);
Daniel Gagnon, Twinsburg, OH (US);
Chuanyong Bai, Solon, OH (US);
Zhicong Yu, Highland Hts., OH (US);
Amit Jain, Solon, OH (US);
Calvin R. Maurer, Jr., San Jose, CA (US);
Accuray, Inc., Sunnyvale, CA (US);
Abstract
An x-ray imaging apparatus and associated methods are provided to receive measured projection data from a wide aperture scan of a wide axial region and a narrow aperture scan of a narrow axial region within the wide axial region and determine an estimated scatter in the wide axial region using an optimized scatter estimation technique. The optimized scatter estimation technique is based on the difference between the measured scatter in the narrow axial region and the estimated scatter in the narrow axial region. Kernel-based scatter estimation/correction techniques can be fitted to minimize the scatter difference in the narrow axial region and thereafter applying the fitted (optimized) kernel-based scatter estimation/correction to the wide axial region. Optimizations can occur in the projection data domain or the reconstruction domain. Iterative processes are also utilized.