The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 18, 2022
Filed:
Aug. 13, 2019
Agama-x Co., Ltd., Tokyo, JP;
Masahiro Sato, Kanagawa, JP;
Motofumi Baba, Kanagawa, JP;
Monta Ido, Kanagawa, JP;
Masayoshi Nakao, Kanagawa, JP;
Kengo Tokuchi, Kanagawa, JP;
Agama-X Co., Ltd., Tokyo, JP;
Abstract
A biometric information measurement system includes a first measurement apparatus, a second measurement apparatus, and a control apparatus. The first measurement apparatus measures first biometric information of a subject. The second measurement apparatus measures second biometric information which is biometric information of the subject and which is different from the first biometric information. The control apparatus changes a condition of measurement performed by the second measurement apparatus on the basis of the first biometric information.