The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 18, 2022
Filed:
Oct. 27, 2017
Essilor International, Charenton-le-Pont, FR;
Jean-Luc Perrin, Charenton-le-Pont, FR;
Guilhem Escalier, Charenton-le-Pont, FR;
Isabelle Poulain, Charenton-le-Pont, FR;
Benjamin Rousseau, Charenton-le-Pont, FR;
CĂ©cile Petignaud, Charenton-le-Pont, FR;
Gildas Marin, Charenton-le-Pont, FR;
Essilor International, Charenton-le-Pont, FR;
Abstract
Disclosed is a method for measuring the refraction of an individual by a refraction measuring appliance, including: an initial step of determining at least one initial value of a visuo-postural parameter of the individual; a step of processing the initial value in order to deduce at least one initial value of a regulating parameter of the refraction measuring appliance, the regulating parameter being associated with the visuo-postural parameter; a step of regulating the refraction measuring appliance according to the initial value of the regulating parameter; and a step of measuring the refraction of the individual by the measuring appliance regulated in this way. Also disclosed is a method for the optical design of an ophthalmic lens, and to a pair of glasses including such a lens.