The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 11, 2022

Filed:

Jan. 12, 2017
Applicant:

Telefonaktiebolaget Lm Ericsson (Publ), Stockholm, SE;

Inventors:

Jing Fu, Solna, SE;

Xiaoyu Lan, Täby, SE;

Liyi Meng, Täby, SE;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 15/16 (2006.01); H04L 29/06 (2006.01); G06F 16/435 (2019.01); H04L 12/26 (2006.01);
U.S. Cl.
CPC ...
H04L 65/80 (2013.01); G06F 16/435 (2019.01); H04L 43/067 (2013.01); H04L 43/08 (2013.01); H04L 43/16 (2013.01);
Abstract

A method and detector for detecting anomalies among media event sequences are disclosed. One method includes obtaining a first profile of media event data over a first time period, where the first profile is a first distribution of different media event sequences. Each sequence is associated with a number of occurrences of the sequence and the first profile having a first profile vector. The method further includes obtaining a second profile of media event data over a second time period less than the first time period. The second profile is a second distribution of the different media sequences and the second profile having a second profile vector. The method also includes comparing the first profile vector and the second profile vector, and determining one of a presence and absence of at least one anomaly in the second profile vector of media event data based on the comparison.


Find Patent Forward Citations

Loading…