The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 11, 2022

Filed:

Jun. 14, 2017
Applicant:

Kabushiki Kaisha Toshiba, Tokyo, JP;

Inventors:

Yuma Sano, Kanagawa, JP;

Manabu Nishiyama, Tokyo, JP;

Tomoki Watanabe, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); G06T 7/73 (2017.01); B60R 1/00 (2006.01); B60K 35/00 (2006.01); G06N 7/00 (2006.01); G05D 1/02 (2020.01); B60W 30/16 (2020.01); B60W 30/12 (2020.01);
U.S. Cl.
CPC ...
G06T 7/73 (2017.01); B60K 35/00 (2013.01); B60R 1/00 (2013.01); B60W 30/16 (2013.01); G05D 1/024 (2013.01); G05D 1/0257 (2013.01); G05D 1/0274 (2013.01); G06K 9/00791 (2013.01); G06K 9/00805 (2013.01); G06N 7/005 (2013.01); B60R 2300/301 (2013.01); B60R 2300/802 (2013.01); B60W 30/12 (2013.01); B60W 2420/42 (2013.01); B60W 2554/00 (2020.02); B60W 2710/18 (2013.01); B60W 2710/207 (2013.01); B60W 2720/106 (2013.01); G05D 1/0246 (2013.01); G05D 2201/0213 (2013.01); G06T 2207/30252 (2013.01); G06T 2207/30261 (2013.01);
Abstract

An information processing apparatus according to one embodiment includes a processing circuit. The processing circuit calculates a first presence probability of an object present around a moving body with positional information measured by each of a plurality of sensors having different characteristics, acquires non-measurement information indicating that the positional information on the object has not been obtained for each of the sensors, and determines a second presence probability of the object based on the first presence probability and the non-measurement information.


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