The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 11, 2022
Filed:
Nov. 07, 2019
Fujitsu Limited, Kawasaki, JP;
FUJITSU LIMITED, Kawasaki, JP;
Abstract
An image inspection learning method implemented by a computer, the method includes: generating non-defective region data obtained by extracting, from a learning image including a defective region, a non-defective region other than the defective region; inputting the learning image into an image processing program for image inspection that detects the defective region in an input image as a detection target for the defective region, and acquiring an output image; extracting a feature quantity for a predetermined region of the output image; classifying, based on the non-defective region data, the feature quantity for the predetermined region into a non-defective feature quantity corresponding to the non-defective region and a defective feature quantity corresponding to the defective region; and using the non-defective feature quantity to learn a discriminator that discriminates a region of the output image outputted from the image processing program.