The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 11, 2022

Filed:

Jul. 04, 2020
Applicant:

Shenzhen University, Shenzhen, CN;

Inventors:

Hui Huang, Shenzhen, CN;

Zihao Yan, Shenzhen, CN;

Ruizhen Hu, Shenzhen, CN;

Assignee:

Shenzhen University, Shenzhen, CN;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/62 (2006.01); G06T 7/33 (2017.01);
U.S. Cl.
CPC ...
G06K 9/6262 (2013.01); G06K 9/6232 (2013.01); G06K 9/6256 (2013.01); G06T 7/344 (2017.01); G06T 2207/10028 (2013.01); G06T 2207/20081 (2013.01);
Abstract

A method and a device of acquiring an appearance model, a computer device and a storage medium. The method includes acquiring a set of target point clouds, the set of target point clouds including at least two point clouds, each of the point clouds being obtained by sampling a local area of a target object; then performing a registration and a completion for the at least two point clouds to obtain a processed point cloud, wherein the registration is to transform different point clouds into a same coordinate system, and the completion is to add points in other areas of the object according to existing points in a point cloud to be completed; and finally acquiring the appearance model of the target object according to the processed point cloud. The method can improve applicability of the appearance model of the target object acquired only by registration technique.


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