The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 11, 2022

Filed:

Nov. 04, 2019
Applicant:

Nec Laboratories America, Inc., Princeton, NJ (US);

Inventors:

Gaurav Sharma, Newark, CA (US);

Manmohan Chandraker, Santa Clara, CA (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); G06K 9/62 (2006.01); G06N 3/08 (2006.01);
U.S. Cl.
CPC ...
G06K 9/00744 (2013.01); G06K 9/6201 (2013.01); G06K 9/6256 (2013.01); G06K 9/6269 (2013.01); G06N 3/08 (2013.01);
Abstract

A computer-implemented method is provided for domain adaptation between a source domain and a target domain. The method includes applying, by a hardware processor, an attention network to features extracted from images included in the source and target domains to provide attended features relating to a given task to be domain adapted between the source and target domains. The method further includes applying, by the hardware processor, a deformation network to at least some of the attended features to align the attended features between the source and target domains using warping to provide attended and warped features. The method also includes training, by the hardware processor, a target domain classifier using the images from the source domain. The method additionally includes classifying, by the hardware processor using the trained target domain classifier, at least one image from the target domain.


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