The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 11, 2022
Filed:
May. 21, 2020
Emc Ip Holding Company Llc, Hopkinton, MA (US);
EMC IP Holding Company LLC, Hopkinton, MA (US);
Abstract
Described is a system for creating an intelligent testing queue for improved quality assurance (QA) testing of services (or microservices). The system may perform a graphical analysis of interactions between services to derive testing constraints. For example, the system may monitor services to identify interactions (e.g. API accesses) between the services, and store the interactions as a directed graph representation. The system may traverse the directed graph (e.g. via a breadth-first search) to determine service dependencies. Based on the probability of failure for the testing operations and the service dependencies, the system create a specialized testing queue. By performing testing operations according to the specialized queue, the system may improve certain metrics associated with QA processes such as mean time to failure (MTTF) and mean time to diagnose (MTTD).