The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 11, 2022

Filed:

Oct. 15, 2019
Applicant:

Nec Laboratories America, Inc., Princeton, NJ (US);

Inventors:

Wenchao Yu, Plainsboro, NJ (US);

Jingchao Ni, Princeton, NJ (US);

Bo Zong, West Windsor, NJ (US);

Wei Cheng, Princeton Junction, NJ (US);

Haifeng Chen, West Windsor, NJ (US);

LuAn Tang, Pennington, NJ (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G05B 23/02 (2006.01); G06N 20/10 (2019.01); G06F 16/901 (2019.01); G06K 9/62 (2006.01); G06F 17/18 (2006.01);
U.S. Cl.
CPC ...
G05B 23/0283 (2013.01); G06F 16/9024 (2019.01); G06F 17/18 (2013.01); G06K 9/6256 (2013.01); G06K 9/6267 (2013.01); G06N 20/10 (2019.01);
Abstract

Systems and methods for predicting system device failure are provided. The method includes performing graph-based predictive maintenance (GBPM) to determine a trained ensemble classification model for detecting maintenance ready components that includes extracted node features and graph features. The method includes constructing, based on testing data and the trained ensemble classification model, an attributed temporal graph and the extracted node features and graph features. The method further includes concatenating the extracted node features and graph features. The method also includes determining, based on the trained ensemble classification model, a list of prediction results of components that are to be scheduled for component maintenance.


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