The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 11, 2022

Filed:

Mar. 16, 2018
Applicants:

Ricoh Company, Ltd., Tokyo, JP;

Fanuc Corporation, Yamanashi, JP;

Inventors:

Satoru Goto, Kanagawa, JP;

Junichi Takami, Kanagawa, JP;

Yasunobu Shirata, Tokyo, JP;

Tomoki Umezawa, Kanagawa, JP;

Yohsuke Muramoto, Kanagawa, JP;

Takafumi Horio, Kanagawa, JP;

Yu Teshima, Kanagawa, JP;

Assignees:

RICOH COMPANY, LTD., Tokyo, JP;

FANUC CORPORATION, Yamanashi, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G05B 19/4065 (2006.01); G06N 20/00 (2019.01); G06N 5/04 (2006.01);
U.S. Cl.
CPC ...
G05B 19/4065 (2013.01); G06N 5/04 (2013.01); G06N 20/00 (2019.01); G05B 2219/50308 (2013.01);
Abstract

A device includes: a first acquiring unit to acquire context information corresponding to running operation among pieces of context information; a second acquiring unit to acquire detection information output from a detecting unit detecting a physical quantity of a target device; an extracting unit to extract, from the detection information, feature information indicating a feature of the detection information in an interval including a specific operation interval of the target device; a selecting unit to select reference feature information used as reference based on the feature information, and sequentially select pieces of target feature information; a calculating unit to calculate a likelihood of a process interval based on a comparison between the reference feature information and each piece of target feature information; a determining unit to determine whether the target feature information corresponding to the likelihood is included in the process interval based on the likelihood; and an estimating unit to estimate the process interval based on a determination result.


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