The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 11, 2022
Filed:
Jun. 20, 2017
Rodenstock Gmbh, Munich, DE;
Markus Tiemann, Munich, DE;
Martin Dumm, Kirchberg, DE;
Monika Füss, Munich, DE;
Roswitha Fendt, Munich, DE;
Holger Wild, Schaufling, DE;
Rodenstock GmbH, Munich, DE;
Abstract
In a method for checking the centration of at least one spectacle lens, the spectacle lens is arranged in a field of capture of an image capturer; at least one image of the spectacle lens is captured by means of the image capturer; and positions of functional engravings of the spectacle lens in the captured image are determined. Furthermore, at least one lens contour of the at least one spectacle lens in the captured image is determined and the centration of the spectacle lens is checked taking into account the determined positions of the functional engravings, the determined lens contour and a known, wearer-dependent target geometry of the centration.