The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 11, 2022

Filed:

Sep. 11, 2020
Applicant:

Fujifilm Corporation, Tokyo, JP;

Inventors:

Naoto Iwakiri, Kanagawa, JP;

Munetaka Kato, Kanagawa, JP;

Haruyasu Nakatsugawa, Kanagawa, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 27/146 (2006.01); H01L 31/0392 (2006.01); G01T 1/20 (2006.01); G01T 1/202 (2006.01); A61B 6/00 (2006.01); G01T 1/208 (2006.01);
U.S. Cl.
CPC ...
G01T 1/20184 (2020.05); A61B 6/00 (2013.01); A61B 6/4208 (2013.01); G01T 1/208 (2013.01); G01T 1/2018 (2013.01); G01T 1/2023 (2013.01); G01T 1/20181 (2020.05); H01L 27/14663 (2013.01); H01L 27/14689 (2013.01); H01L 31/03926 (2013.01);
Abstract

A radiation detector includes a flexible substrate, plural pixels provided on the substrate and each including a photoelectric conversion element, a scintillator stacked on the substrate and including plural columnar crystals, and a bending suppression member configured to suppress bending of the substrate. The bending suppression member has a rigidity that satisfies R≥L−r/tan Φ+4r·{(L−r/tan Φ)−(d/2)}/d, wherein L is an average height of the columnar crystals, r is an average radius of the columnar crystals, d is an average interval between the columnar crystals, Φ is an average tip angle of the columnar crystals, and R is a radius of curvature of bending occurring in the substrate due to the weight of the scintillator.


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