The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 11, 2022
Filed:
Aug. 29, 2018
Siemens Aktiengesellschaft, Munich, DE;
Siemens Technology and Services Pvt. Ltd., Mumbai, IN;
Siemens Energy, Inc., Orlando, FL (US);
Vinay Ramanath, Charlotte, NC (US);
Tobias Keute, Charlotte, NC (US);
Anant Kumar Mishra, Charlotte, NC (US);
Himanshu Bhatnagar, Charlotte, NC (US);
Siemens Aktiengesellschaft, Munich, DE;
Abstract
Technical solutions are described for performing sensitivity analysis for engineering systems in spatial-temporal domain. An example method includes receiving a set of process parameters and retrieving a multidimensional dataset containing historical values of the process parameters and corresponding output values. The method further includes selecting a sampling algorithm to divide the multidimensional dataset into multiple subspaces, and selecting multiple samples (x), one sample from each subspace. The method further includes perturbing the samples, computing a first effect (EE) on an output value (y), and computing a second effect (SEE) of perturbing a pair of samples (xand x) on the output value. The method further includes computing a sensitivity coefficient of the process parameters on the output value using the second effect for xand x, the first effect for x, and the first effect for x. An automatic visualization scheme for the global sensitivity results is also provided.