The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 11, 2022
Filed:
May. 27, 2020
Applicant:
University of Central Florida Research Foundation, Inc., Orlando, FL (US);
Inventors:
Guifang Li, Orlando, FL (US);
Shengli Fan, Orlando, FL (US);
Seth Smith-Dryden, Orlando, FL (US);
Bahaa Saleh, Orlando, FL (US);
Assignee:
UNIVERSITY OF CENTRAL FLORIDA RESEARCH FOUNDATION, INC., Orlando, FL (US);
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B 9/02 (2006.01);
U.S. Cl.
CPC ...
G01B 9/02091 (2013.01); G01B 9/0203 (2013.01); G01B 9/02007 (2013.01);
Abstract
A non-destructive iterative interferometric tomographic technique for imaging and reconstruction of phase objects as well as objects with complex permittivity and, particularly, to iterative optical diffraction tomographic (iODT) imaging and reconstruction of phase objects with high refractive index (RI) contrast, complex structures, and/or large optical path differences (OPDs) against the background, which cause multiple scattering, and applications thereof.