The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 11, 2022

Filed:

Mar. 31, 2017
Applicant:

Landmark Graphics Corporation, Houston, TX (US);

Inventors:

Ahinoam Pollack, Stanford, CA (US);

Yang Peng, Austin, TX (US);

Kainan Wang, Houston, TX (US);

Ming-Kang Shih, Houston, TX (US);

Krisha Hansel Tracy, Cypress, TX (US);

Jesse Mathias Lomask, Houston, TX (US);

Assignee:

Landmark Graphics Corporation, Houston, TX (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
E21B 47/022 (2012.01); E21B 47/12 (2012.01);
U.S. Cl.
CPC ...
E21B 47/022 (2013.01); E21B 47/12 (2013.01);
Abstract

Well logs can be automatically correlated using dynamic warping with descriptors. For example, a computing device can receive user input indicating a manual correlation between a first node in a first well-log and a second node in a second well-log. The computing device can use the manual correlation to automatically determine a combination of descriptors usable to correlate the first node to the second node. The computing device can then perform dynamic warping on other well logs using the combination of descriptors determined by using the first well log and the second well log. This may provide more accurate correlations between well logs.


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