The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 11, 2022

Filed:

Jun. 01, 2020
Applicant:

Shanghai United Imaging Healthcare Co., Ltd., Shanghai, CN;

Inventor:

Yifeng Jiang, Shanghai, CN;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 6/03 (2006.01); G21K 1/02 (2006.01); A61B 6/00 (2006.01);
U.S. Cl.
CPC ...
A61B 6/032 (2013.01); A61B 6/4021 (2013.01); A61B 6/4291 (2013.01); A61B 6/5205 (2013.01); A61B 6/5258 (2013.01); A61B 6/5264 (2013.01); A61B 6/582 (2013.01); G21K 1/025 (2013.01);
Abstract

A method for determining a CT focal point includes determining a first intensity of first radiation incident on a first detector unit of a scanner, wherein the scanner may include a non-uniform anti-scatter grid (ASG) and a radiation source, and the non-uniform ASG may be configured according to a first focal point of the radiation source. The method also includes determining a second intensity of second radiation incident on a second detector unit of the scanner, wherein the first radiation and the second radiation are emitted from the radiation source with a second focal point. The method further includes determining a displacement of the second focal point from the first focal point based on the first intensity and the second intensity.


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