The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 11, 2022
Filed:
Jan. 30, 2020
Reichert, Inc., Depew, NY (US);
Scott W. Parks, East Amherst, NY (US);
David G. Kelkenberg, Akron, NY (US);
Russell J. Bonaventura, Williamsville, NY (US);
Reichert, Inc., Depew, NY (US);
Abstract
A spatially compact, lightweight positioning system for guiding an operator in positioning an ophthalmic instrument relative to an eye of a test subject has first and second light sources and an area detector spaced apart from a measurement axis of the instrument and from each other for providing positioning images which may be evaluated relative to stored calibration image information to determine current position of the instrument relative to the eye. The first and second light sources may fit within a lateral distance less than or equal to 25 mm. First and second illumination axes associated with the light sources may reside in a horizontal plane containing the measurement axis, and an observation axis of the area detector may reside in a vertical plane containing the measurement axis. The light sources and the area detector may be intersected by a plane which is normal to the measurement axis.