The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 04, 2022

Filed:

Jan. 23, 2019
Applicant:

Smiths Heimann Sas, Vitry sur Seine, FR;

Inventors:

Guillaume Jegou, Vitry sur Seine, FR;

Christophe Mielot, Vitry sur Seine, FR;

Assignee:

SMITHS HEIMANN SAS, Vitry sur Seine, FR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01J 35/30 (2006.01); H01J 35/08 (2006.01); H05G 1/52 (2006.01); H01J 35/16 (2006.01);
U.S. Cl.
CPC ...
H05G 1/52 (2013.01); H01J 35/16 (2013.01); H01J 2235/081 (2013.01); H01J 2235/086 (2013.01);
Abstract

An inspection radiation source is provided. The inspection radiation source includes an electron accelerator for generating an electron current, and a target for the electron current including a first part and a second part. This first part is configured to be at least partly exposed to the electron current on an impact area having a first width in a direction substantially perpendicular to the electron current, and inhibit propagation of the electron current. The second part has a second width in the direction substantially perpendicular to the electron current, the second width of the second part being smaller than the first width of the impact area, the second part being configured to be at least partly exposed to the electron current, and generate inspection radiation by emitting X-rays in response to being exposed to the electron current.


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