The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 04, 2022
Filed:
Oct. 04, 2019
Wuhan University, Hubei, CN;
Yigang He, Hubei, CN;
Bolun Du, Hubei, CN;
Yaru Zhang, Hubei, CN;
Jiajun Duan, Hubei, CN;
Liulu He, Hubei, CN;
WUHAN UNIVERSITY, Hubei, CN;
Abstract
The disclosure provides a silicon photovoltaic cell scanning eddy current thermography detection platform and a defect classification method. The technical solution adopted by the disclosure is: firstly, fixing the position of the electromagnetic inductive coil and the thermal imager, and using the main conveyor belt to carry the silicon photovoltaic cell to move forward on the production line to form a scanning eddy current heating of the silicon photovoltaic cell. Secondly, the defect temperature information is obtained through the thermal imager in terms of thermal image sequences. Thirdly, the feature extraction algorithms are used to extract the silicon photovoltaic cell defect features. Finally, the image classification algorithms are used to classify the silicon photovoltaic cell defects, and the sorting conveyor belts are used to realize the automatic sorting of silicon photovoltaic cells with different types of defects on the production line.