The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 04, 2022

Filed:

May. 19, 2019
Applicant:

Mikro Mesa Technology Co., Ltd., Apia, WS;

Inventor:

Li-Yi Chen, Tainan, TW;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/26 (2020.01); H01L 29/73 (2006.01); H03K 17/12 (2006.01); H03F 3/45 (2006.01); H01L 29/786 (2006.01); H01L 29/66 (2006.01); H01L 21/66 (2006.01);
U.S. Cl.
CPC ...
H01L 29/7317 (2013.01); G01R 31/26 (2013.01); G01R 31/2621 (2013.01); H01L 22/14 (2013.01); H01L 29/66265 (2013.01); H01L 29/786 (2013.01); H03F 3/4508 (2013.01); H03K 17/122 (2013.01);
Abstract

A method for rapidly gathering a sub-threshold swing from a thin film transistor is provided. The method includes: electrically connecting an operational amplifier and an anti-exponential component to a source terminal of the thin film transistor; performing a measuring process to the thin film transistor in which the measuring process is inputting multiple values of a gate voltage to a gate terminal, such that multiple values of an output voltage are correspondingly generated from the output terminal of the operational amplifier; and performing a fitting process to the output voltage corresponding to the thin film transistor in which the fitting process is fitting at least two of said multiple values of the output voltage to get the sub-threshold swing.


Find Patent Forward Citations

Loading…