The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 04, 2022
Filed:
Jun. 18, 2019
Tetra Laval Holdings & Finance S.a., Pully, CH;
Johan Wendel, Genarp, SE;
Andreas Åberg, Malmö, SE;
Peter Johannesson, Malmö, SE;
Erik Bergvall, Eslöv, SE;
TETRA LAVAL HOLDINGS & FINANCE S.A., Pully, CH;
Abstract
A method for detection of deviations in packaging containers is disclosed, comprising creating a virtual model of a packaging container in a virtual coordinate system (x, y, z), defining a deformation zone on a surface of the virtual model, creating a defined deviation in the deformation zone having a defined geometry and coordinates in the virtual coordinate system (x, y, z) to create a controlled deformation of the virtual model, producing an image rendering of the virtual model with said controlled deformation to generate image features representing a deviation in the packaging container, associating the image features with different categories of deviations, and inputting the image features to a machine learning-based model for subsequent detection of categories of deviations in packaging containers in a packaging machine based on the image features. A system for detection of deviations is also disclosed.