The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 04, 2022
Filed:
Jun. 27, 2019
Applicant:
Vivotek Inc., New Taipei, TW;
Inventors:
Cheng-Chieh Liu, New Taipei, TW;
Chih-Yen Lin, New Taipei, TW;
Assignee:
VIVOTEK INC., New Taipei, TW;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); G06T 7/70 (2017.01); G06T 7/20 (2017.01);
U.S. Cl.
CPC ...
G06T 7/70 (2017.01); G06T 7/20 (2013.01); G06T 2207/30196 (2013.01); G06T 2207/30232 (2013.01);
Abstract
A queue information analyzing method is applied to an image analyzing apparatus. A monitoring image captured by the image analyzing apparatus has a triggering area. The queue information analyzing method includes identifying a first candidate object stayed within the triggering area, forming a sampling range via the first candidate object, determining whether a second candidate object stayed within the sampling range belongs to a queue of the first candidate object, and acquiring an amount and a accumulated time of candidate objects about the queue.