The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 04, 2022

Filed:

Apr. 10, 2020
Applicant:

Canon Virginia, Inc., Newport News, VA (US);

Inventors:

Bradley Scott Denney, Irvine, CA (US);

Yunzhe Zhao, Irvine, CA (US);

Assignee:

Canon Virginia, Inc., Newport News, VA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/00 (2017.01);
U.S. Cl.
CPC ...
G06T 7/001 (2013.01); G06T 7/0006 (2013.01); G06T 2207/20081 (2013.01); G06T 2207/30108 (2013.01);
Abstract

Some embodiments of systems, devices, and methods obtain a plurality of training images; obtain one or more target regions; generate one or more respective statistical characterizations of the one or more target regions; obtain a test image; locate the one or more target regions on the test image; compare the one or more target regions in the test image to the one or more respective statistical characterizations of the one or more target regions; and detect anomalies in the one or more target regions in the test image based at least in part on the comparison of the one or more target regions in the test image to the one or more respective statistical characterizations of the one or more target regions.


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