The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 04, 2022
Filed:
Sep. 11, 2018
Boe Technology Group Co., Ltd., Beijing, CN;
Xuefei Sun, Beijing, CN;
Xinxing Wang, Beijing, CN;
Jaegeon You, Beijing, CN;
Jikai Yao, Beijing, CN;
BOE TECHNOLOGY GROUP CO., LTD., Beijing, CN;
Abstract
A spacer supportability evaluation method and device as well as a computer readable storage medium are provided. The method includes acquiring initial distribution images of spacers and corresponding support pads on a substrate, performing binary grayscaling processing to obtain distribution images of spacers and corresponding support pads, obtaining two binary matrices according to the distribution images, subjecting the two binary matrices to convolution in a spatial domain or to multiplication in a frequency domain to obtain an equivalent support matrix, calculating a number of elements in the equivalent support matrix whose values are a first value to obtain a number of supported pixels. The supportability of spacers is evaluated by acquiring parameters or design drawings of the spacers to calculate suitable size and positional arrangement of each spacer, improving the supportability of spacers and keeps the cell gap of the liquid crystal cell stable and uniform.