The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 04, 2022
Filed:
Jan. 25, 2019
Applicant:
Samsung Electronics Co., Ltd., Suwon-si, KR;
Inventors:
Assignee:
Samsung Electronics Co., Ltd., Suwon-si, KR;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/00 (2017.01); G06N 3/08 (2006.01); G06N 20/00 (2019.01);
U.S. Cl.
CPC ...
G06T 7/0008 (2013.01); G06N 3/08 (2013.01); G06N 20/00 (2019.01); G06T 7/001 (2013.01); G06T 7/0004 (2013.01); G06T 2207/10004 (2013.01); G06T 2207/20016 (2013.01); G06T 2207/20081 (2013.01); G06T 2207/20084 (2013.01); G06T 2207/30164 (2013.01);
Abstract
A method, performed by a process management apparatus, of managing vision inspection using an artificial intelligence (AI) model and an apparatus therefor are provided. The method includes obtaining first process data related to a first manufacturing process through which a first object passes, identifying a first region on which intensive inspection is to be performed in an entire region of the first object using the AI model and the first process data, controlling a first vision inspector to inspect the identified first region, and determining whether a defect is present in the identified first region.