The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 04, 2022

Filed:

Dec. 20, 2019
Applicant:

Fujitsu Limited, Kawasaki, JP;

Inventors:

Yutaka Katsuyama, Yokohama, JP;

Eigo Segawa, Kawasaki, JP;

Assignee:

FUJITSU LIMITED, Kawasaki, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/00 (2017.01); G06T 7/11 (2017.01); G01N 21/88 (2006.01); G06T 11/20 (2006.01);
U.S. Cl.
CPC ...
G06T 7/0002 (2013.01); G01N 21/8803 (2013.01); G01N 21/8851 (2013.01); G06T 7/11 (2017.01); G06T 11/203 (2013.01); G06T 2207/30168 (2013.01);
Abstract

An information processing apparatus includes: a processor configured to: partition an image of a structure into regions; detect, for target regions each including crack points among the regions, a representative line segment representing the crack points included in each target region as a basic line segment for each target region; generate, based on basic line segments whose end points are close to each other among the detected basic line segments, a tree structure having an end point of a specific basic line segment as a root; and detect, among routes in the generated tree structure, routes from a top to a bottom of the tree structure corresponding to a basic line segment group in which values indicating degrees of coupling probability between the basic line segments are highest and a total length of the basic line segments coupled is longest, as a stroke corresponding to crack lines.


Find Patent Forward Citations

Loading…