The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 04, 2022
Filed:
Mar. 16, 2018
Siemens Aktiengesellschaft, Munich, DE;
Siemens Aktiengesellschaft, Munich, DE;
Abstract
A system and method for visual anomaly localization in a test image includes generating, in plurality of scaled iterations, attention maps for a test image using a trained classifier network, using image-level. A current attention map is generated using an inversion of the classifier network on a condition that a forward pass of the test image in the classifier network detects a first class. One or more attention regions of the current attention map may be extracted and resized as a sub-image. For each scaled iteration, extraction of one or more regions of a current attention map is performed on a condition that the current attention map is significantly different than the preceding attention map. Visual localization of a region for the class in the test image is based on one or more of the attention maps.