The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 04, 2022
Filed:
May. 29, 2020
International Business Machines Corporation, Armonk, NY (US);
Paulo Rodrigo Cavalin, Rio de Janiero, BR;
Carmen Nilda Mena Paz, Rio de Janiero, BR;
Jaione Tirapu Azpiroz, Rio de Janiero, BR;
Ana Paula Appel, São Paulo, BR;
Alexandre Alves, São Paulo, BR;
INTERNATIONAL BUSINESS MACHINES CORPORATION, Armonk, NY (US);
Abstract
A product quality analysis and control system is provided. The product quality analysis and control system includes a processing system that is configured to receive data of objective qualities of a product from multiple data gathering modules. Each of the multiple data gathering modules is respectively positioned at corresponding nodes of a supply chain and is configured to receive from sensors data of objective qualities of a product when the product is at each of the corresponding nodes. The processing system includes a model repository and a data evaluation module. The data evaluation module is configured to select, from the model repository, a model associated with a type of the product and to use the model to analyze the data to identify changes in the objective qualities along the supply chain.